US 12,130,224 B2
Test platform apparatus
Ryan Jeffrey, Cape Canaveral, FL (US); Carol Craig, Merritt Island, FL (US); Anthony Boschi, Merritt Island, FL (US); and Michael Bush, Washington, IL (US)
Assigned to Sidus Space, Inc., Merritt Island, FL (US)
Filed by Sidus Space, Inc., Merritt Island, FL (US)
Filed on Jun. 30, 2022, as Appl. No. 17/854,145.
Prior Publication US 2024/0003804 A1, Jan. 4, 2024
Int. Cl. G01N 17/00 (2006.01)
CPC G01N 17/002 (2013.01) 35 Claims
OG exemplary drawing
 
1. A test platform apparatus to test materials in a space setting, the system comprising:
a lower member;
an upper member;
a plurality of rear support members extending between the upper member and the lower member;
a plurality of medial support members extending between the upper member and the lower member;
a plurality of front support members extending between the upper member and the lower member;
a plurality of side members extending between the lower member and the upper member;
a plurality of attachment members carried by an external surface of the lower member and configured to connect to a portion of an external platform;
a plurality of mounting members carried by an internal surface of at least one of the lower member and the side members; and
a plurality of heatsinks connected to the internal surface of the lower member;
wherein the lower member has a plurality of heatsink receiving holes formed therein;
wherein each of the plurality of heatsink receiving holes are adapted to receive portions of the heatsinks to connect the plurality of heatsinks to the internal surface of the lower member;
wherein the plurality of heatsinks are configurable and moveable on the internal surface of the lower member.