US 12,457,115 B2
Data integrity validation via degenerate keys
Michael John Line, University Park, MD (US)
Assigned to TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US)
Filed by Texas Instruments Incorporated, Dallas, TX (US)
Filed on Apr. 3, 2024, as Appl. No. 18/625,414.
Application 18/625,414 is a continuation of application No. 17/824,327, filed on May 25, 2022, granted, now 11,985,255.
Application 17/824,327 is a continuation of application No. 16/693,795, filed on Nov. 25, 2019, granted, now 11,374,770, issued on Jun. 28, 2022.
Prior Publication US 2024/0267231 A1, Aug. 8, 2024
This patent is subject to a terminal disclaimer.
Int. Cl. H04L 9/32 (2006.01); H04L 9/06 (2006.01); H04L 9/08 (2006.01)
CPC H04L 9/3249 (2013.01) [H04L 9/0643 (2013.01); H04L 9/0825 (2013.01); H04L 9/3263 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method, comprising:
creating a template for a second key based on a first key;
copying a first plurality of values from the first key into the template for the second key;
setting a second plurality of values to 1;
copying the second plurality of values into the template for the second key;
creating the second key based on the template for the second key; and
utilizing the second key to perform a data integrity validation test.