| CPC H04B 17/22 (2023.05) | 20 Claims |

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1. An apparatus comprising:
an analog front-end (AFE) circuit configured to receive an analog input signal, wherein the AFE circuit includes an analog signal path having one or more analog circuits implemented therein;
a test signal generator configured to input an analog test signal into the analog signal path, wherein the AFE circuit is configured to combine the analog input signal and the analog test signal and further configured to generate, using one or more analog circuits in the analog signal path, an analog output signal based on the analog input signal combined with the analog test signal; and
a digital signal processing (DSP) circuit configured to process a digital input value that corresponds to the analog output signal, wherein the DSP circuit is configured to perform calibrations of respective parameters of the one or more analog circuits, wherein to perform the calibrations, the DSP circuit is configured to separate a digital representation of the analog test signal from a remainder of the digital input value.
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