| CPC H01L 23/49838 (2013.01) [H01L 23/3128 (2013.01); H01L 23/49822 (2013.01); H01L 24/13 (2013.01); H01L 24/16 (2013.01); H01L 24/32 (2013.01); H01L 24/73 (2013.01); H01L 24/05 (2013.01); H01L 24/48 (2013.01); H01L 24/81 (2013.01); H01L 2224/0401 (2013.01); H01L 2224/05624 (2013.01); H01L 2224/05647 (2013.01); H01L 2224/05684 (2013.01); H01L 2224/13111 (2013.01); H01L 2224/13139 (2013.01); H01L 2224/13147 (2013.01); H01L 2224/16227 (2013.01); H01L 2224/32225 (2013.01); H01L 2224/48145 (2013.01); H01L 2224/48227 (2013.01); H01L 2224/73204 (2013.01); H01L 2224/81411 (2013.01); H01L 2224/81439 (2013.01); H01L 2224/81444 (2013.01); H01L 2224/81455 (2013.01); H10B 80/00 (2023.02)] | 20 Claims | 

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               1. A semiconductor package comprising: 
            a package substrate including a redistribution layer including first pads and second pads on an upper surface of the package substrate and a solder mask layer having an opening entirely exposing the first pads and exposing at least portion of each of the second pads; 
                a semiconductor chip on the upper surface of the package substrate and including connection pads electrically connected to the redistribution layer; 
                connection bumps below the semiconductor chip and connecting the connection pads to the first pads; and 
                a non-conductive film layer between the semiconductor chip and the package substrate, 
                wherein the second pads are respectively disposed on both sides of the first pads at least in a first direction, and 
                the connection bumps are spaced apart from the second pads and the solder mask layer in the first direction. 
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