| CPC H01L 21/6715 (2013.01) [H01L 21/027 (2013.01)] | 20 Claims |

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1. A substrate processing apparatus comprising:
a substrate supporter supporting a substrate; and
a processing solution supply apparatus configured to supply a processing solution onto the substrate supported on the substrate supporter,
wherein the processing solution supply apparatus comprises:
a trap tank storing the processing solution;
a supply line connected to the trap tank to supply the processing solution onto the substrate;
a first vent line connected to the trap tank to discharge the processing solution including bubbles or gases from the trap tank; and
a first static charge measurement unit connected to the first vent line to measure a static charge of the processing solution, and comprising a first Faraday cup and a first static charge measurement unit connected to the first Faraday cup.
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