| CPC H01J 37/32174 (2013.01) [H01J 37/32146 (2013.01); H01J 37/3244 (2013.01); H01J 37/32568 (2013.01); H01L 21/31138 (2013.01); H01L 21/32051 (2013.01); H01J 2237/332 (2013.01); H01J 2237/334 (2013.01)] | 16 Claims |

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1. A plasma processing apparatus for performing plasma processing on a substrate, comprising:
a processing chamber;
a substrate support on which the substrate is placed, the substrate support being disposed in the processing chamber;
a lower electrode provided in the substrate support, the lower electrode being grounded;
an upper electrode disposed to face the lower electrode;
a gas supply source to supply a processing gas to a space between the upper electrode and the substrate support;
a radio frequency power supply to apply RF power to the upper electrode to generate plasma of the processing gas;
a matcher matching a load impedance with an internal impedance of the RF power supply, the matcher connected downstream of the RF power supply; and
a voltage waveform shaping processor provided between the matcher and the upper electrode to shape a voltage waveform of the RF power supply to suppress a positive voltage of an RF voltage applied to the upper electrode,
wherein the voltage waveform shaping processor includes:
a capacitor that is disposed, downstream of the matcher, in a power supply line of the RF power supply, and
a ground circuit that includes a first diode, the ground circuit being branched downstream of the capacitor in the power supply line and grounded through the first diode.
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