US 12,455,299 B2
Contact element for a probe head for testing high-frequency electronic devices and relating probe head
Roberto Crippa, Cernusco Lombardone (IT)
Assigned to TECHNOPROBE S.P.A., Cernusco Lombardone (IT)
Appl. No. 18/252,141
Filed by TECHNOPROBE S.P.A., Cernusco Lombardone (IT)
PCT Filed Nov. 10, 2021, PCT No. PCT/EP2021/081283
§ 371(c)(1), (2) Date May 8, 2023,
PCT Pub. No. WO2022/101288, PCT Pub. Date May 19, 2022.
Claims priority of application No. 102020000027182 (IT), filed on Nov. 13, 2020.
Prior Publication US 2024/0012025 A1, Jan. 11, 2024
Int. Cl. G01R 1/067 (2006.01); G01R 1/073 (2006.01)
CPC G01R 1/06772 (2013.01) [G01R 1/06722 (2013.01); G01R 1/06727 (2013.01); G01R 1/07314 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A contact element for a probe head for an electronic device test apparatus, the contact element comprising a body extending along a longitudinal axis between a first contact end, which is adapted to contact pads of a device under test, and a second and opposite contact end, wherein the body comprises:
a first section which extends along the longitudinal axis starting from the first contact end towards the second contact end and is made of an electrically conductive material, the first section extending over a distance less than 1000 μm;
a second section which extends along the longitudinal axis starting from the second contact end towards the first contact end and is made of an electrically conductive material; and
a third section which is interposed between the first section and the second section and is made of electrically insulating material,
wherein the first section, the second section, and the third section follow each other along the longitudinal axis so that the first contact end is included only in the first section and the second contact end is included only in the second section, and wherein the third section is configured to electrically insulate the first section from the second section,
wherein the contact probe is configured so that, in use, a signal from a device under test is carried only by the first section, and
wherein the second section has a length higher than the length of the first section.