US 12,455,237 B2
Method, device and system for optical property measurement based on spatial frequency domain imaging
Yanyu Zhao, Beijing (CN); and Yubo Fan, Beijing (CN)
Assigned to Beihang University, Beijing (CN)
Filed by Beihang University, Beijing (CN)
Filed on Apr. 5, 2023, as Appl. No. 18/131,346.
Application 18/131,346 is a continuation of application No. PCT/CN2022/077840, filed on Feb. 25, 2022.
Claims priority of application No. 202110304223.7 (CN), filed on Mar. 22, 2021.
Prior Publication US 2023/0243745 A1, Aug. 3, 2023
Int. Cl. G01N 21/47 (2006.01); G01N 21/17 (2006.01); G01N 21/49 (2006.01)
CPC G01N 21/4795 (2013.01) [G01N 21/1717 (2013.01); G01N 21/49 (2013.01); G01N 2021/1725 (2013.01)] 7 Claims
OG exemplary drawing
 
1. A method for optical property measurement based on spatial frequency domain imaging, comprising:
obtaining a first target sinusoidal light pattern with a specified spatial frequency by modulating first light emitted by a light source in a spatial frequency domain, the number of coded bits of the first target sinusoidal light pattern is smaller than a preset number of bits, wherein the preset number of bits is greater than or equal to 2 bits, and the number of coded bits of the first target sinusoidal light pattern is 1 bit;
irradiating the first target sinusoidal light pattern to a surface of a sample to be detected;
collecting light intensity distribution data of second light, the second light is formed after the first target sinusoidal light pattern is reflected by the sample to be detected; and
determining one or more optical property parameters of the sample to be detected according to the light intensity distribution data of the second light.