US 12,455,213 B2
Measurement system having a capacitance probe and an optical probe
Eli Warren, Wethersfield, CT (US); and Bryan J. Hackett, Berlin, CT (US)
Assigned to RTX CORPORATION, Farmington, CT (US)
Filed by Raytheon Technologies Corporation, Farmington, CT (US)
Filed on Feb. 1, 2023, as Appl. No. 18/104,756.
Prior Publication US 2024/0255383 A1, Aug. 1, 2024
Int. Cl. G01M 15/14 (2006.01); G01D 5/24 (2006.01); G01D 5/26 (2006.01)
CPC G01M 15/14 (2013.01) [G01D 5/24 (2013.01); G01D 5/268 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A measurement system, comprising:
a probe assembly including a capacitance probe and an optical probe;
the capacitance probe comprising a capacitance sensor that forms a sensor face of the probe assembly, wherein an aperture projects axially through the capacitance sensor to the sensor face; and
the optical probe configured with an optical line of sight through the aperture into a volume adjacent the sensor face.