US 12,455,164 B2
Surveying instrument, surveying method and surveying program
Fumio Ohtomo, Saitama (JP); Takeshi Sasaki, Tokyo-to (JP); and Kaoru Kumagai, Tokyo-to (JP)
Assigned to TOPCON CORPORATION, Tokyo (JP)
Filed by TOPCON Corporation, Tokyo-to (JP)
Filed on Nov. 16, 2021, as Appl. No. 17/527,421.
Claims priority of application No. 2020-195717 (JP), filed on Nov. 26, 2020.
Prior Publication US 2022/0163328 A1, May 26, 2022
Int. Cl. G01C 3/08 (2006.01); G01C 15/00 (2006.01); G01C 15/02 (2006.01)
CPC G01C 15/006 (2013.01) [G01C 15/02 (2013.01)] 14 Claims
OG exemplary drawing
 
1. A surveying instrument comprising: a surveying instrument main body having a reference optical axis, and an operation panel communicable with said surveying instrument main body, wherein said surveying instrument main body includes a distance measuring module configured to project a distance measuring light, receive a reflected distance measuring light, and measure a distance to an object and a reflection intensity, an optical axis deflector configured to deflect said distance measuring light with respect to said reference optical light, a projecting direction detector configured to detect a projecting direction of said distance measuring light, a measuring direction image pickup module configured to include said object and acquire an observation image in a predetermined relationship with said reference optical axis, and an arithmetic control module, said operation panel includes an operation module, a display module, and an arithmetic module, said arithmetic control module is configured to cause said optical axis deflector to perform a scan with a predetermined scan pattern while causing said projecting direction detector to detect a projecting direction of said distance measuring light and cause said distance measuring module to measure said object along a locus of said scan pattern, and said arithmetic module or said arithmetic control module is configured to create an overlay image as a superimposition of said locus on an observation image taken by said measuring direction image pickup module, display said overlay image in said display module, and calculate a formula of a straight line or a curve line based on a measurement result of intersections or a closest points to said intersections between said straight line or said curve line drawn along a ridge line or a contour of said object and said locus of said scan pattern on said displayed overlay image,
wherein said arithmetic module or said arithmetic control module is configured to select at least two points from said intersections between said straight line and said locus, and select at least three points from said intersections between said curve line and said locus.