| CPC B65D 85/70 (2013.01) [B65D 25/14 (2013.01); B65D 81/26 (2013.01); G03F 7/32 (2013.01); G03F 7/325 (2013.01); G03F 7/0012 (2013.01)] | 18 Claims |
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1. A method for producing a pattern using a resist composition and a chemical liquid comprising,
a step of applying the chemical liquid to a substrate,
a step of forming a resist film by applying the resist composition to the substrate,
a step of exposing the resist film using an EUV exposure machine, and
a step of developing the resist film to form the pattern, and
wherein the chemical liquid comprises one or more organic solvents selected from the group consisting of decane, undecane, and a compound other than an alkane and an alkene; and
one or more organic solvents selected from the group consisting of decane and undecane, and
one or more organic components selected from the group consisting of alkanes having 12 to 50 carbon atoms and alkenes having 12 to 50 carbon atoms, and
wherein a content of the organic components is 0.10 to 1,000,000 mass ppt with respect to a total mass of the chemical liquid.
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