US 12,454,013 B2
Coated cutting tool
Takao Katagiri, Iwaki (JP)
Assigned to TUNGALOY CORPORATION, Fukushima (JP)
Filed by TUNGALOY CORPORATION, Fukushima (JP)
Filed on Feb. 27, 2023, as Appl. No. 18/175,519.
Claims priority of application No. 2022-055287 (JP), filed on Mar. 30, 2022.
Prior Publication US 2023/0311215 A1, Oct. 5, 2023
Int. Cl. B32B 18/00 (2006.01); B23B 27/14 (2006.01); C23C 14/06 (2006.01); C23C 14/32 (2006.01)
CPC B23B 27/148 (2013.01) [C23C 14/0641 (2013.01); C23C 14/325 (2013.01); B23B 2228/105 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A coated cutting tool comprising a substrate and a coating layer formed on the substrate, wherein
the coating layer has an alternately laminated structure of a first layer and a second layer;
the first layer contains a compound having a composition represented by a following formula (1):
(AlaMbTi1-a-b)N  (1)
wherein M represents at least one of a Mo element and a W element; a is an atomic ratio of an Al element to a total of the Al element, an element represented by M, and a Ti element, and satisfies 0.75≤a≤0.90; and b is an atomic ratio of the element represented by M to the total of the Al element, the element represented by M, and the Ti element, and satisfies 0.00<b≤0.20;
the second layer contains a compound having a composition represented by a following formula (2), the compound contained in the second layer being different from the compound contained in the first layer:
(AlcMdTi1-c-d)N  (2)
wherein M represents at least one of a Mo element and a W element; c is an atomic ratio of an Al element to a total of the Al element, an element represented by M, and a Ti element, and satisfies 0.75≤c≤0.90; and d is an atomic ratio of the element represented by M to the total of the Al element, the element represented by M, and the Ti element, and satisfies 0.00≤d≤0.12;
at least one of a and c is 0.80 or more;
an average thickness per layer of the first layer is 2 nm or more and 100 nm or less;
an average thickness per layer of the second layer is 2 nm or more and 100 nm or less;
an average thickness of the alternately laminated structure is 0.5 μm or more and 5.0 μm or less; and
where a sum of diffraction peak intensities of a cubic crystal (111) plane and a cubic crystal (200) plane is denoted by Icub and a sum of diffraction peak intensities of a hexagonal crystal (110) plane and a hexagonal crystal (100) plane is denoted by Ihex in X-ray diffraction of the alternately laminated structure, Ihex/Icub is 0.00 or more and 0.40 or less.