US 12,125,668 B2
Electron microscopy grid
Wouter Van Putte, Diksmuide (BE); Jean-Pierre Timmermans, Mol (BE); and Jan Vanfleteren, Gentbrugge (BE)
Assigned to UNIVERSITEIT ANTWERPEN, Antwerp (BE); IMEC VZW, Leuven (BE); and UNIVERSITEIT GENT, Ghent (BE)
Appl. No. 17/431,849
Filed by UNIVERSITEIT ANTWERPEN, Antwerp (BE); IMEC VZW, Leuven (BE); and UNIVERSITEIT GENT, Ghent (BE)
PCT Filed Feb. 25, 2020, PCT No. PCT/EP2020/054930
§ 371(c)(1), (2) Date Aug. 18, 2021,
PCT Pub. No. WO2020/173952, PCT Pub. Date Sep. 3, 2020.
Claims priority of application No. 19158982 (EP), filed on Feb. 25, 2019.
Prior Publication US 2022/0157559 A1, May 19, 2022
Int. Cl. H01J 37/26 (2006.01); B01J 19/00 (2006.01)
CPC H01J 37/261 (2013.01) [B01J 19/0046 (2013.01); B01J 2219/00432 (2013.01)] 16 Claims
OG exemplary drawing
 
16. A kit-of-parts for forming an electron microscopy grid, comprising:
(i) a perforated substrate,
(ii) a support film having a thickness of 60 Å or less, and having linkers attached to linker regions thereon in a non-random pattern, the linker regions having a width of 20 nm or less, the linkers comprising at least one affinity group for immobilizing an analyte and comprising linkers of differing lengths and/or differing morphology, so as to promote different analyte orientations.