US 11,797,732 B2
Automated analog and mixed-signal circuit design and validation
Ashish Khandelwal, Frisco, TX (US); Sreenivasan K. Koduri, Dallas, TX (US); Nikhil Gupta, Plano, TX (US); and Timothy W. Fischer, McKinney, TX (US)
Assigned to TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US)
Filed by TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US)
Filed on Apr. 30, 2021, as Appl. No. 17/245,000.
Claims priority of provisional application 63/116,578, filed on Nov. 20, 2020.
Claims priority of provisional application 63/037,385, filed on Jun. 10, 2020.
Prior Publication US 2021/0390232 A1, Dec. 16, 2021
This patent is subject to a terminal disclaimer.
Int. Cl. G06F 30/27 (2020.01); G06F 30/392 (2020.01); G06N 3/084 (2023.01); G06F 30/398 (2020.01); G06F 30/337 (2020.01); G06N 20/00 (2019.01); G06N 3/08 (2023.01); G06N 20/20 (2019.01); G06F 30/367 (2020.01); G06F 30/373 (2020.01); G06F 30/3308 (2020.01); G06F 18/2415 (2023.01); G06N 3/045 (2023.01); G06F 111/20 (2020.01); G06F 111/04 (2020.01)
CPC G06F 30/27 (2020.01) [G06F 18/24155 (2023.01); G06F 30/337 (2020.01); G06F 30/3308 (2020.01); G06F 30/367 (2020.01); G06F 30/373 (2020.01); G06F 30/392 (2020.01); G06F 30/398 (2020.01); G06N 3/045 (2023.01); G06N 3/08 (2013.01); G06N 3/084 (2013.01); G06N 20/00 (2019.01); G06N 20/20 (2019.01); G06F 2111/04 (2020.01); G06F 2111/20 (2020.01)] 21 Claims
OG exemplary drawing
 
1. A method comprising:
receiving a data object representing a circuit for a first process technology, the circuit including a first sub-circuit, the first sub-circuit including a first electrical component and a second electrical component, the first electrical component and the second electrical component arranged in a first topology;
identifying the first sub-circuit in the data object by comparing the first topology to a stored topology, the stored topology associated with the first process technology;
identifying sub-circuit physical parameter values associated with the first electrical component and the second electrical component of the first sub-circuit;
determining a set of sub-circuit performance parameter values for the first sub-circuit based on a first machine learning (ML) model of the first sub-circuit and the identified sub-circuit physical parameter values;
converting the identified first sub-circuit to a second sub-circuit for a second process technology based on the determined set of sub-circuit performance parameter values; and
outputting the second sub-circuit.