US 11,796,588 B2
Direct current measurement of 1/f transistor noise
Yuguo Wang, Plano, TX (US); Steven Loveless, Sachse, TX (US); Tathagata Chatterjee, Allen, TX (US); and Jerry Doorenbos, Tucson, AZ (US)
Assigned to Texas Instruments Incorporated, Dallas, TX (US)
Filed by TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US)
Filed on Nov. 29, 2021, as Appl. No. 17/537,007.
Application 17/537,007 is a division of application No. 15/859,244, filed on Dec. 29, 2017, granted, now 11,249,130.
Prior Publication US 2022/0082608 A1, Mar. 17, 2022
Int. Cl. G01R 31/26 (2020.01)
CPC G01R 31/2626 (2013.01) 16 Claims
OG exemplary drawing
 
1. An integrated circuit, comprising:
a noise generator circuit, comprising:
a first amplifier including a single transistor pair, wherein the single transistor pair is operable to generate 1/f noise;
an output amplifier coupled to the first amplifier and configured to generate a 1/f noise signal as a function of the 1/f noise; and
a noise envelope detector circuit, comprising:
a low pass filter operable to pass low frequency signals of the 1/f noise signal as a filtered 1/f noise signal; and
a second amplifier or a comparator coupled to the low pass filter and operable to output a direct current (DC) voltage signal according to an envelope of the filtered 1/f noise signal, wherein the DC voltage signal is a function of an envelope of the filtered 1/f noise signal.