US 12,451,979 B2
Method, apparatus and system for measuring nonlinear correlation parameters of nonlinear device
Tong Ye, Beijing (CN); Zhenning Tao, Beijing (CN); Xiaofei Su, Beijing (CN); and Chengwu Yang, Beijing (CN)
Assigned to Fujitsu Limited, Kawasaki (JP)
Filed by Fujitsu Limited, Kawasaki (JP)
Filed on Apr. 24, 2023, as Appl. No. 18/305,655.
Application 18/305,655 is a continuation of application No. PCT/CN2020/125281, filed on Oct. 30, 2020.
Prior Publication US 2023/0261765 A1, Aug. 17, 2023
Int. Cl. H04B 17/13 (2015.01); G01R 31/28 (2006.01)
CPC H04B 17/13 (2015.01) [G01R 31/2822 (2013.01)] 17 Claims
OG exemplary drawing
 
1. An apparatus to measure nonlinear correlation parameters of a nonlinear device, comprising:
a memory; and
a processor coupled to the memory to control execution of a process to,
perform band-stop filtering on a signal to be measured to generate a notch signal, and calculate a first nonlinear correlation parameter of the nonlinear device when the signal to be measured is transmitted according to a first output signal of the nonlinear device after the notch signal is input into the nonlinear device;
calculate gain compression correction coefficients according to a second output signal of the nonlinear device after a first input signal is input into the nonlinear device, the first input signal and the signal to be measured having identical power and different signal probability distribution; and
correct the first nonlinear correlation parameter according to the gain compression correction coefficients to obtain a second nonlinear correlation parameter of the nonlinear device when the signal to be measured is transmitted.