US 12,451,976 B2
Method and apparatus for an accurate determination of a transfer function of a device under test
Andreas Lagler, Rosenheim (DE); Florian Ramian, Karlsfeld (DE); and Florian Gerbl, Olching (DE)
Assigned to Rohde & Schwarz GmbH & Co. KG, Munich (DE)
Filed by Rohde & Schwarz GmbH & Co. KG, Munich (DE)
Filed on Apr. 12, 2023, as Appl. No. 18/134,014.
Prior Publication US 2024/0348345 A1, Oct. 17, 2024
Int. Cl. H04B 17/00 (2015.01)
CPC H04B 17/0082 (2013.01) 18 Claims
OG exemplary drawing
 
1. A method for an accurate determination of a transfer function of a device under test (DUT) comprising the steps of:
measuring a transfer function of the device under test across a frequency range in response to a wideband signal applied to the device under test;
removing data of the measured transfer function at frequencies where the applied wideband signal comprises a low power spectral density; and
processing remaining data of the measured transfer function to determine an accurate transfer function of said device under test.