| CPC H01L 23/49844 (2013.01) [H01L 23/5386 (2013.01); H01L 24/11 (2013.01); H01L 24/16 (2013.01); H01L 24/19 (2013.01); H01L 24/25 (2013.01); H01L 24/32 (2013.01); H01L 24/73 (2013.01); H01L 25/071 (2013.01); H10D 30/015 (2025.01); H10D 30/47 (2025.01); H10D 64/258 (2025.01); H01L 2224/113 (2013.01); H01L 2224/16145 (2013.01); H01L 2224/2511 (2013.01); H01L 2224/2541 (2013.01); H01L 2224/73204 (2013.01); H01L 2224/73259 (2013.01); H01L 2924/13064 (2013.01)] | 19 Claims |

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1. A semiconductor device comprising:
a first semiconductor structure comprising a first high electron mobility transistor (HEMT) device on a first side of a first substrate, wherein the first HEMT device comprises a first gate, a first source, and a first drain;
a second semiconductor structure stacked above and bonded to the first semiconductor structure, wherein the second semiconductor structure comprises a second HEMT device and a third HEMT device on a first side of a second substrate, wherein the second HEMT device comprises a second gate, a second source, and a second drain that is electrically connected to the first source, wherein the third HEMT device comprises a third gate, a third source, and a third drain that is electrically connected to the first gate, wherein the first side of the first substrate faces the first side of the second substrate; and
an underfill sandwiched between the first semiconductor structure and the second semiconductor structure.
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