| CPC G09G 3/006 (2013.01) [G09G 3/32 (2013.01); G09G 2310/0275 (2013.01); G09G 2330/10 (2013.01); G09G 2330/12 (2013.01)] | 20 Claims |
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1. A method of inspecting a pixel, the method comprising:
measuring a first drain current by applying a first gate voltage with a first voltage interval to a gate terminal of a transistor included in a test pattern in a first voltage period;
generating a first gate voltage-drain current graph based on the first drain current;
measuring a second drain current by applying a second gate voltage which is lower than the first gate voltage with a second voltage interval which is different from the first voltage interval to the gate terminal of the transistor in a second voltage period which is different from the first voltage period;
generating a second gate voltage-drain current graph based on the second drain current; and
determining a defect of the transistor based on the first gate voltage-drain current graph and the second gate voltage-drain current graph.
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