US 12,449,477 B2
Apparatuses and methods for jitter measurement
Seamus Anthony Ryan, Nenagh (IE); Pablo Ventura, Museros (ES); and Guillermo Oliver, Valencia (ES)
Assigned to Analog Devices International Unlimited Company, Limerick (IE)
Filed by Analog Devices International Unlimited Company, Limerick (IE)
Filed on Nov. 15, 2023, as Appl. No. 18/510,224.
Prior Publication US 2025/0155499 A1, May 15, 2025
Int. Cl. H04L 7/00 (2006.01); G01R 31/317 (2006.01)
CPC G01R 31/31709 (2013.01) [G01R 31/31713 (2013.01); G01R 31/31727 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A circuit for measuring jitter, the circuit comprising:
an edge detector circuit configured to:
analyze a window of samples at an expected position of a plurality of input edges of a plurality of input waveforms, and
detect the plurality of input edges;
a movement counter circuit configured to:
measure a displacement of each input edge, with respect to a previous position, of the plurality of input edges, and
output a value of the displacement of each input edge;
a plurality of accumulators each configured to:
increment a corresponding counter value of a plurality of accumulator values in response to each value of the displacement of a corresponding accumulator of the plurality of accumulators, and
output the plurality of accumulator values; and
a summation circuit configured to:
sum the plurality of accumulator values output by the plurality of accumulators to generate an accumulated jitter value, and
send jitter result information based on the accumulated jitter value.