US 12,449,444 B2
Test system configuration adapter systems and methods
Eddy Wayne Chow, San Jose, CA (US)
Assigned to Advantest Corporation, Tokyo (JP)
Filed by Advantest Corporation, Tokyo (JP)
Filed on Dec. 4, 2023, as Appl. No. 18/528,548.
Application 18/528,548 is a division of application No. 17/099,610, filed on Nov. 16, 2020, granted, now 11,867,720.
Prior Publication US 2024/0103037 A1, Mar. 28, 2024
Int. Cl. G01R 1/04 (2006.01); G01R 31/3185 (2006.01); G01R 31/319 (2006.01)
CPC G01R 1/0441 (2013.01) [G01R 31/318519 (2013.01); G01R 31/31905 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A testing method comprising:
selecting a first type of procedure for a device under test, wherein the first type of procedure comprises a functional test;
performing the first type of procedure on the device under test;
selecting a second type of procedure for the device under test, wherein the second type of procedure comprises a supplemental operation; and
performing the second type of procedure on the device under test, wherein the device under test remains coupled to a test system throughout the selecting the first type of procedure for the device under test, the performing the first type of procedure on the device under test, the selecting the second type of procedure for the device under test, and the performing the second type of procedure on the device under test.