US 12,449,356 B2
Apparatuses, systems, and methods for sample testing
Chen Feng, Mount Laurel, NJ (US); Suresh Venkatarayalu, Waxhaw, NC (US); and Robert Timothy Kester, Friendswood, TX (US)
Assigned to Hand Held Products, Inc., Charlotte, NC (US)
Filed by Hand Held Products, Inc., Charlotte, NC (US)
Filed on Sep. 17, 2021, as Appl. No. 17/447,996.
Application 17/447,996 is a continuation of application No. 17/302,536, filed on May 5, 2021, granted, now 12,196,672.
Claims priority of provisional application 63/154,476, filed on Feb. 26, 2021.
Claims priority of provisional application 63/198,609, filed on Oct. 29, 2020.
Claims priority of provisional application 63/021,416, filed on May 7, 2020.
Prior Publication US 2022/0003669 A1, Jan. 6, 2022
Int. Cl. G01N 21/45 (2006.01); B23D 63/00 (2006.01); C23C 2/00 (2006.01); G02B 6/42 (2006.01); B29C 37/00 (2006.01); G01N 21/41 (2006.01)
CPC G01N 21/45 (2013.01) [B23D 63/008 (2013.01); C23C 2/51 (2022.08); G02B 6/4204 (2013.01); A61H 2201/5007 (2013.01); B01D 2313/70 (2022.08); B01D 2313/701 (2022.08); B29C 2037/903 (2013.01); C02F 2209/006 (2013.01); G01N 2021/4166 (2013.01); G01N 2201/0846 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A sample sensing device comprising:
a waveguide component comprising:
a waveguide layer defining a first waveguide portion and a second waveguide portion, wherein the waveguide layer further defines a step portion protruding out vertically from the first waveguide portion, wherein the step portion connects the first waveguide portion with the second waveguide portion, and wherein a thickness of the second waveguide portion is greater than a thickness of the first waveguide portion, wherein the first waveguide portion receives a light portion configured to transverse through the first waveguide portion and the second waveguide portion; and
an interface layer having a sample opening, said sample opening configured to allow a sample to be disposed on a surface of the second waveguide portion, wherein an identity of the sample is configured to be detected based on an interference fringe pattern generated by propagation of light in the first waveguide portion and the second waveguide portion and the sample disposed on the surface of the second waveguide portion;
wherein the first waveguide portion is configured to allow propagation of light in at least one or more transversal mode, wherein the second waveguide portion is configured to allow propagation of light in at least one or more transversal mode, wherein a count of traversal mode for propagation of light in the second waveguide portion is more compared to a count of traversal modes of propagation of light in the first waveguide portion.