US 12,447,719 B2
Metal-clad laminate, wiring board, resin-including metal foil, and resin composition
Akira Irifune, Fukushima (JP); Shun Yamaguchi, Fukushima (JP); Fuminori Satou, Fukushima (JP); Tatsuya Arisawa, Fukushima (JP); and Mitsuyoshi Nishino, Fukushima (JP)
Assigned to PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD., Osaka (JP)
Appl. No. 17/768,153
Filed by PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD., Osaka (JP)
PCT Filed Oct. 15, 2020, PCT No. PCT/JP2020/038926
§ 371(c)(1), (2) Date Apr. 11, 2022,
PCT Pub. No. WO2021/079817, PCT Pub. Date Apr. 29, 2021.
Claims priority of application No. 2019-194376 (JP), filed on Oct. 25, 2019.
Prior Publication US 2023/0094806 A1, Mar. 30, 2023
Int. Cl. B32B 15/08 (2006.01); B32B 15/20 (2006.01); B32B 5/02 (2006.01); B32B 15/12 (2006.01); B32B 15/14 (2006.01)
CPC B32B 15/08 (2013.01) [B32B 15/20 (2013.01); B32B 5/022 (2013.01); B32B 5/024 (2013.01); B32B 15/12 (2013.01); B32B 15/14 (2013.01); B32B 2250/40 (2013.01); B32B 2255/06 (2013.01); B32B 2255/205 (2013.01); B32B 2260/023 (2013.01); B32B 2260/046 (2013.01); B32B 2262/0269 (2013.01); B32B 2262/0276 (2013.01); B32B 2262/101 (2013.01); B32B 2270/00 (2013.01); B32B 2307/206 (2013.01); B32B 2457/08 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A metal-clad laminate comprising an insulating layer and a metal foil in contact with at least one surface of the insulating layer,
wherein the insulating layer contains a cured product of a resin composition containing a polymer having a structural unit represented by the following Formula (1) in a molecule and an acenaphthylene compound as a curing agent for curing the polymer, and
the metal foil is a metal foil in which:
a first nickel element amount, on a surface on a side in contact with the insulating layer, measured by X-ray photoelectron spectroscopy is 0.1 at % to 2.5 at % with respect to a total element amount measured by X-ray photoelectron spectroscopy,
a second nickel element amount, on a surface on a side in contact with the insulating layer when the surface is sputtered for 1 minute at a speed of 3 nm/min in terms of SiO2, measured by X-ray photoelectron spectroscopy is 0.1 at % to 3.0 at % with respect to a total element amount measured by X-ray photoelectron spectroscopy, and
a nitrogen element amount, on a surface on a side in contact with the insulating layer, measured by X-ray photoelectron spectroscopy is 3.0 at % to 5.5 at % with respect to a total element amount measured by X-ray photoelectron spectroscopy in the metal foil:

OG Complex Work Unit Chemistry
wherein in Formula (1), Z represents an arylene group, R1 to R3 each independently represent a hydrogen atom or an alkyl group, and R4 to R6 each independently represent a hydrogen atom or an alkyl group having 1 to 6 carbon atoms.