CPC H01L 21/0228 (2013.01) [C23C 16/34 (2013.01); C23C 16/45542 (2013.01); H01L 21/0217 (2013.01); H01L 21/02186 (2013.01); H01L 21/02205 (2013.01); H01L 21/02211 (2013.01); H01L 21/02274 (2013.01)] | 16 Claims |
1. A method of depositing a nitride film, the method comprising:
exposing a substrate to a precursor to form a reactive species on the substrate;
exposing the reactive species to a first plasma gas flow formed from a first plasma gas to form an activated species, the first plasma gas comprising N2; and
exposing the activated species to a second plasma gas flow formed from a second plasma gas to form the nitride film, the second plasma gas comprising NH3, wherein the first plasma gas flow and the second plasma gas flow are separated by a purge gas, and the method defines a deposition cycle, and the deposition cycle is repeated until a predetermined thickness of the nitride film has been formed.
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