US 12,119,068 B2
Program continuation strategies after memory device power loss
Gary F. Besinga, Boise, ID (US); Vamsi Pavan Rayaprolu, San Jose, CA (US); Steven Michael Kientz, Westminster, CO (US); and Renato C. Padilla, Folsom, CA (US)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Feb. 18, 2022, as Appl. No. 17/675,241.
Prior Publication US 2023/0268014 A1, Aug. 24, 2023
Int. Cl. G11C 16/34 (2006.01); G11C 16/10 (2006.01); G11C 16/26 (2006.01)
CPC G11C 16/3459 (2013.01) [G11C 16/102 (2013.01); G11C 16/26 (2013.01); G11C 16/3404 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A system comprising:
a memory device; and
a processing device, operatively coupled with the memory device, to perform operations comprising:
detecting a power up event of the memory device;
responsive to detecting the power up event, selecting an open block of the memory device, wherein the open block comprises a set of pages;
analyzing the set of pages to obtain at least one of:
at least one charge loss metric indicative of charge loss associated with a set of programmed pages of the set of pages, the set of programmed pages comprising at least one of: an oldest written page of the open block, or at least one first sample page associated with at least one respective individual charge loss metric; or
at least one charge gain metric indicative of charge gain associated with a set of erased pages of the set of pages, the set of erased pages comprising at least one of: an initial erased page of the open block, or at least one second sample page associated with at least one respective individual charge gain metric;
determining, based on at least one of the at least one charge loss metric or the at least one charge gain metric, whether the open block is valid for programming; and
responsive to determining that the open block is valid for programming, keeping the open block open for programming.