US 12,117,924 B2
Context-based test suite generation as a service
Muralikrishna Nidugala, Karnataka (IN); Ravi Teja Jammulapati, Karnataka (IN); Krishnaprasad Bidare Prabhakar, Karnataka (IN); Anup Kumar Sahu, Karnataka (IN); and Aryan Mehta, Karnataka (IN)
Assigned to Hewlett Packard Enterprise Development LP, Spring, TX (US)
Filed by Hewlett Packard Enterprise Development LP, Spring, TX (US)
Filed on Dec. 14, 2023, as Appl. No. 18/539,665.
Application 18/539,665 is a continuation of application No. 17/806,868, filed on Jun. 14, 2022, granted, now 11,874,762.
Prior Publication US 2024/0111664 A1, Apr. 4, 2024
This patent is subject to a terminal disclaimer.
Int. Cl. G06F 11/36 (2006.01); G06N 5/022 (2023.01)
CPC G06F 11/3684 (2013.01) [G06F 11/3688 (2013.01); G06N 5/022 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A system comprising:
processing circuitry; and
a memory coupled with the processing circuitry, the memory storing instructions, wherein the processing circuitry is configured to execute the instructions to:
detect a code change to source code;
identify an associated product feature and one or more dependent product features impacted by the code change to the source code;
select, based on the associated product feature and the one or more dependent product features, a first subset of test cases related to the associated product feature and a second subset of test cases related to the one or more dependent product features;
responsive to determining that there exist a test gap indicating there are insufficient test cases to cover a certain product feature or product component, automatically generate a third subset of test cases to fill the test gap based on the associated product feature and the one or more dependent product features; and
execute a set of test cases, wherein the set of test cases comprises the first subset of test cases, the second subset of test cases, and the third subset of test cases.