| CPC H04N 13/25 (2018.05) [H04N 13/296 (2018.05)] | 15 Claims |
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1. A method for determining a depth profile of a field of view, the method comprising:
projecting, by a projector, at least one light pattern onto the field of view, the projection occurring in a time window of less than 10 μsec;
imaging the projected pattern, by a camera sensor and optics, synchronized with the projection of the pattern during at least one observation window within the time window,
wherein the camera sensor comprises a matrix of pixels, each pixel comprising a photodetector,
wherein the pixels are in a false status when no light is detected by the corresponding photodetector, and in a true status when light is detected by the corresponding photodetector thereby obtaining a first binary matrix of pixels representing the field of view;
separating the projected pattern from an ambient light noise on the first binary matrix of pixels by considering only pixels in the true status having at least one neighbor pixel also in the true status on the matrix of pixel obtained in at least one observation within the time window thereby obtaining a second binary matrix of pixels representing the projected pattern;
calculating the depth profile corresponding to the projected pattern, based on triangulation between the projector position, the camera position, and the second binary matrix of pixel; and
scanning the projected pattern by repeating the projecting, imaging, separating, and calculating on the entire field of view for determining the depth profile on the entire field of view;
wherein each isolated element of the pattern is extending in the binary representation on at least two contiguous pixels.
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