US 12,445,140 B2
Analog signal generation device and calibration method of same
Hirofumi Ono, Kanagawa (JP); and Koji Yamashita, Kanagawa (JP)
Assigned to ANRITSU CORPORATION, Kanagawa (JP)
Filed by ANRITSU CORPORATION, Kanagawa (JP)
Filed on Mar. 26, 2024, as Appl. No. 18/616,665.
Claims priority of application No. 2023-061206 (JP), filed on Apr. 5, 2023.
Prior Publication US 2024/0340016 A1, Oct. 10, 2024
Int. Cl. H03M 1/06 (2006.01); H03M 1/10 (2006.01)
CPC H03M 1/0607 (2013.01) [H03M 1/1014 (2013.01)] 4 Claims
OG exemplary drawing
 
1. An analog signal generation device comprising:
a DA converter that adjusts signal power of a digital signal according to a DAC correction amount and then converts the digital signal into an analog signal;
a detector that detects the analog signal and outputs a detection signal;
a storage unit that stores a characteristic equation for calculating the DAC correction amount based on a differential voltage between a detection voltage, which is a voltage of the detection n signal, and a reference voltage; and
a control unit that calculates a new DAC correction amount based on the differential voltage by using the characteristic equation, in a case where the differential voltage when the digital signal having signal power of a predetermined value is input to the DA converter is larger than a threshold value, and returns the new DAC correction amount to an original DAC correction amount, and corrects the characteristic equation based on a relationship between the DAC correction amount for the differential voltage and a variation amount of the detection voltage, in a case where the differential voltage is larger than the threshold value even after calculating the new DAC correction amount a prescribed number of times.