US 12,445,070 B2
Using a deadtime interval for back EMF acquisition and measurement
Gheorghe Turcan, Bucharest (RO); and Grig Barbulescu, Rosu-Chiajna (RO)
Assigned to Microchip Technology Incorporated, Chandler, AZ (US)
Filed by Microchip Technology Incorporated, Chandler, AZ (US)
Filed on May 26, 2023, as Appl. No. 18/202,368.
Claims priority of provisional application 63/392,973, filed on Jul. 28, 2022.
Prior Publication US 2024/0039438 A1, Feb. 1, 2024
Int. Cl. H02P 6/182 (2016.01); H02P 6/10 (2006.01); H02P 27/08 (2006.01)
CPC H02P 6/182 (2013.01) [H02P 6/10 (2013.01); H02P 27/08 (2013.01)] 14 Claims
OG exemplary drawing
 
1. An apparatus, comprising:
an acquisition circuit; and
a control circuit to:
cause a first modulation circuit to issue a first set of modulated signals to a first source of alternating current energy, the first set of modulated signals to have a first deadtime wherein a high side switch and a low side switch of the first modulation circuit are open; and
cause the acquisition circuit to acquire a first electrical characteristic of the first source of alternating current energy from the first source of alternating current energy during the first deadtime;
cause a second modulation circuit to issue a second set of modulated signals to a second source of alternating current energy, the second set of modulated signals to have a second deadtime wherein a high side switch and a low side switch of the second modulation circuit are open, the second deadtime synchronous with the first dead time; and
cause the acquisition circuit to acquire a second electrical characteristic of the second source of alternating current energy from the second source of alternating current energy during the second deadtime,
wherein a rising first edge of a modulation cycle of the first set of modulated signals and a rising first edge of the second set of modulated signals are synchronous.