| CPC H01L 23/5389 (2013.01) [H01L 21/4853 (2013.01); H01L 21/4857 (2013.01); H01L 21/561 (2013.01); H01L 21/565 (2013.01); H01L 21/568 (2013.01); H01L 21/6835 (2013.01); H01L 21/78 (2013.01); H01L 23/3128 (2013.01); H01L 23/5383 (2013.01); H01L 23/5386 (2013.01); H01L 24/19 (2013.01); H01L 24/20 (2013.01); H01L 2221/68372 (2013.01); H01L 2224/214 (2013.01)] | 19 Claims |

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1. A semiconductor device, comprising:
a first substrate comprising:
a first dielectric structure; and
a first conductive structure through the first dielectric structure and comprising one or more first conductive redistribution layers;
an electronic component over the first substrate, wherein the electronic component is coupled with the first conductive structure;
a second substrate over the electronic component and comprising:
a second dielectric structure; and
a second conductive structure through the second dielectric structure and comprising one or more second conductive redistribution layers;
a conductive pillar coupled between the first conductive structure and the second conductive structure, wherein the conductive pillar comprises a cylindrical structure;
a body extending between the first substrate and the second substrate, wherein the electronic component and the cylindrical structure of the conductive pillar are in the body; and
an underfill between a top side of the first substrate and a bottom side of the electronic component;
wherein the underfill covers a lateral side of a device interconnect on the bottom side of the electronic component and is over a lateral side of the electronic component; and
wherein a top side of the cylindrical structure of the conductive pillar extends into the second dielectric structure of the second substrate.
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