| CPC H01L 21/02576 (2013.01) [C23C 16/301 (2013.01); C30B 25/14 (2013.01); C30B 29/42 (2013.01); H01L 21/02546 (2013.01); H01L 21/02579 (2013.01); H01L 21/0262 (2013.01); H10D 62/10 (2025.01)] | 17 Claims |

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1. A vapor phase epitaxy method comprising:
growing a Ill-V layer with a doping profile that changes from n-doping to p-doping on a surface of a substrate or a preceding layer in a reaction chamber from a vapor phase from an epitaxial gas flow comprising a carrier gas, at least one first precursor for an element from main group III, and at least one second precursor for an element from main group V;
setting, when a first growth height is reached, an initial n-doping level in the epitaxial gas flow via a ratio, leading to a p-doping, of a first mass flow of the first precursor to a second mass flow of the second precursor and with an addition of a third mass flow of a third precursor for an n-type dopant to the epitaxial gas flow; and
changing the third mass flow and/or the ratio between the first and second mass flow stepwise or continuously over a junction region layer with a growth height of at least 10 μm until a target p-doping level is reached.
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