US 12,444,476 B2
Host controlled media testing of memory
Danilo Caraccio, Milan (IT); Daniele Balluchi, Cernusco sul Naviglio (IT); Niccolò Izzo, Vignate (IT); and Alessandro Orlando, Milan (IT)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Mar. 10, 2023, as Appl. No. 18/120,086.
Claims priority of provisional application 63/319,622, filed on Mar. 14, 2022.
Prior Publication US 2023/0290427 A1, Sep. 14, 2023
Int. Cl. G11C 29/56 (2006.01); G06F 21/44 (2013.01)
CPC G11C 29/56016 (2013.01) [G06F 21/445 (2013.01)] 12 Claims
OG exemplary drawing
 
7. An apparatus, comprising:
a host interface;
a memory interface; and
a controller coupled to the host interface and to the memory interface, wherein the controller is configured to:
store a plurality of identifiers and respective media test lists corresponding to each of the plurality of identifiers, wherein the respective media test lists each include a respective plurality of media tests supported by a memory device coupled to the memory interface;
receive a compute express link (CXL) perform maintenance mailbox command from the host interface that includes one of the plurality of identifiers and a definition of a test mode;
configure the test mode and run a plurality of media tests from the respective media test list corresponding to the one of the plurality of identifiers; and
configure an unconstrained test time for the plurality of media tests in response to the definition of the test mode comprising a factory burn-in test.