US 12,444,470 B2
Nonvolatile memory device and operating method thereof
Jaeduk Yu, Suwon-si (KR); Jonghoon Park, Suwon-si (KR); Yohan Lee, Suwon-si (KR); and Sangsoo Park, Suwon-si (KR)
Assigned to Samsung Electronics Co., Ltd., Gyeonggi-do (KR)
Filed by Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed on Dec. 7, 2023, as Appl. No. 18/532,730.
Claims priority of application No. 10-2023-0000903 (KR), filed on Jan. 3, 2023.
Prior Publication US 2024/0221844 A1, Jul. 4, 2024
Int. Cl. G11C 7/00 (2006.01); G11C 16/04 (2006.01); G11C 16/08 (2006.01); G11C 16/26 (2006.01)
CPC G11C 16/26 (2013.01) [G11C 16/0433 (2013.01); G11C 16/08 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An operating method of a nonvolatile memory device comprising a plurality of cell strings connected to a plurality of word lines, a plurality of string selection lines, and a plurality of ground selection lines, the operating method comprising:
receiving a read command;
in response to the read command, increasing a voltage of a plurality of unselected ground selection lines among the plurality of ground selection lines from an off voltage to an on voltage during a word line setup period;
applying a first voltage to a first selected ground selection line corresponding to a first process characteristic among a plurality of selected ground selection lines until a first time in the word line setup period;
applying a second voltage lower than the first voltage to the first selected ground selection line after the first time in the word line setup period;
applying the first voltage to a second selected ground selection line corresponding to a second process characteristic among the plurality of selected ground selection lines, until a second time earlier than the first time in the word line setup period; and
applying the second voltage to the second selected ground selection line after the second time in the word line setup period.