US 12,444,068 B2
Optical inspection based on repetitive feature comparison
Frederick Seng, Cranbury, NJ (US); Harold Hwang, Cranbury, NJ (US); Brian Piccione, Cranbury, NJ (US); and Kuen-Ting Shiu, Cranbury, NJ (US)
Assigned to LG INNOTEK CO., LTD., Seoul (KR)
Filed by LG INNOTEK CO., LTD., Seoul (KR)
Filed on Aug. 1, 2022, as Appl. No. 17/878,760.
Prior Publication US 2024/0037768 A1, Feb. 1, 2024
Int. Cl. G06T 7/00 (2017.01); G06T 7/564 (2017.01)
CPC G06T 7/564 (2017.01) [G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01)] 17 Claims
OG exemplary drawing
 
1. A computer-implemented method for automated inspection comprising:
scanning, by a sensor module, at least one unit under test;
generating, by the sensor module, image data indicative of the at least one unit;
identifying a feature based on a most-occurring contour of a plurality of contours indicated by the image data;
quantifying, based on a plurality of instances of the feature, an attribute of the plurality of instances of the feature;
quantifying an attribute of an instance of the feature of the plurality of instances of the feature, wherein the attribute of the instance of the feature matches the attribute of the plurality of instances of the feature; and
modifying, based on a value of the quantified attribute of the instance of the feature exceeding a value of the quantified attribute of the plurality of instances of the feature by a threshold, the image data to indicate the instance of the feature.