US 12,444,038 B2
Industrial defect recognition method and system, computing device, and storage medium
Xiudong Wang, Beijing (CN); Xin Jin, Beijing (CN); and Dandan Tu, Shenzhen (CN)
Assigned to HUAWEI CLOUD COMPUTING TECHNOLOGIES CO., LTD., Guizhou (CN)
Filed by Huawei Cloud Computing Technologies Co., Ltd., Guizhou (CN)
Filed on May 12, 2023, as Appl. No. 18/316,757.
Application 18/316,757 is a continuation of application No. PCT/CN2021/124254, filed on Oct. 16, 2021.
Claims priority of application No. 202011268302.9 (CN), filed on Nov. 13, 2020.
Prior Publication US 2023/0281784 A1, Sep. 7, 2023
Int. Cl. G06T 7/00 (2017.01); G06V 10/22 (2022.01); G06V 10/82 (2022.01)
CPC G06T 7/0004 (2013.01) [G06V 10/22 (2022.01); G06V 10/82 (2022.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30108 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method, comprising:
obtaining a to-be-recognized image, wherein the to-be-recognized image is of an industrial product;
extracting, based on a target region detection model, at least one target region from the to-be-recognized image, wherein the at least one target region comprises a first industrial defect;
obtaining, based on the at least one target region and a defect detection model, a defect coarse-selection region and a first defect type of the first industrial defect, wherein the defect coarse-selection region is in a first target region of the at least one target region, and wherein the defect coarse-selection region comprises the first industrial defect; and
determining a size and a first location of the first industrial defect.