US 12,444,035 B2
Pallet inspection system and associated methods
Khurram Soomro, Ocoee, FL (US); Christopher J. Gerou, Orlando, FL (US); Sergio Conejo, Madrid (ES); Moazam Soomro, Orlando, FL (US); and Gonzalo Vaca Castano, Orlando, FL (US)
Assigned to CHEP Technology Pty Limited, Sydney (AU)
Filed by CHEP Technology Pty Limited, Sydney (AU)
Filed on Oct. 11, 2022, as Appl. No. 18/045,579.
Claims priority of provisional application 63/262,452, filed on Oct. 13, 2021.
Prior Publication US 2023/0114085 A1, Apr. 13, 2023
Int. Cl. G06T 7/00 (2017.01); B65G 43/08 (2006.01); G06V 10/764 (2022.01)
CPC G06T 7/0004 (2013.01) [B65G 43/08 (2013.01); G06V 10/764 (2022.01); B65G 2201/0267 (2013.01); B65G 2203/0208 (2013.01); B65G 2203/041 (2013.01); B65G 2203/044 (2013.01); G06T 2207/30136 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A pallet inspection system comprising:
a conveyor configured to move a pallet that is to be inspected, the pallet comprising a top deck and a bottom deck separated by a plurality of spaced apart support blocks positioned therebetween, with nails being used to secure the top and bottom decks to the plurality of support blocks;
a plurality of cameras positioned to generate images of the pallet as the pallet is moved on said conveyor; and
a processor coupled to said plurality of cameras and configured to receive the images for processing, the processing comprising
executing a first algorithm on the images to tag the images having support blocks visible therein, and
executing a second algorithm on the tagged images to detect nails having exposed tips.