| CPC G06F 30/398 (2020.01) [G06F 30/31 (2020.01); G06F 30/392 (2020.01)] | 20 Claims |

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1. A method comprising:
accessing a set of candidate macro placements of hard macros within a circuit design; and
estimating, by a processing device, a quality metric for each candidate macro placement, comprising:
predicting a plurality of model-specific estimates of the quality metric, comprising applying different machine learning models to predict each of the different model-specific estimates, wherein the machine learning models applied for different model-specific estimates are trained using sets of source macro placements for different source circuit designs; and
combining the model-specific estimates of the quality metric, wherein the combining is based on an applicability of (a) the set of source macro placements for each model-specific estimate to (b) the set of candidate macro placements.
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