US 12,443,784 B1
System and method for dual model electromagnetic modeling in an electronic circuit design
Claudia Ursula Roesch, Memmingen (DE); Monica Goel, Santa Clara, CA (US); John Yanjiang Shu, Pleasanton, CA (US); and Richard John O'Donovan, San Jose, CA (US)
Assigned to Cadence Design Systems, Inc., San Jose, CA (US)
Filed by Cadence Design Systems, Inc., San Jose, CA (US)
Filed on Sep. 7, 2022, as Appl. No. 17/939,479.
Int. Cl. G06F 30/398 (2020.01); G06F 30/392 (2020.01); G06F 119/10 (2020.01)
CPC G06F 30/398 (2020.01) [G06F 30/392 (2020.01); G06F 2119/10 (2020.01)] 20 Claims
OG exemplary drawing
 
1. A computer-implemented method for electromigration analysis of a circuit design comprising:
performing a first transient simulation of an electronic design using one or more electronic design tools;
storing a level of current associated with one or more generic passive devices tap points;
identifying a resistor capacitor (RC) model for one or more generic passive devices using the one or more electronic design tools;
performing a second transient simulation for the one or more generic passive devices; and
analyzing a current density obtained from the first and second transient simulation to obtain a single current density map.