US 12,443,178 B2
Machine monitoring system and machine monitoring method
Qun Feng Liu, Shamen (CN); Fujin Wang, Singapore (SG); Kai Ping Huang, Tainan (TW); and Wen Yi Tan, Fujian (CN)
Assigned to United Semiconductor (Xiamen) Co., Ltd., Fujian (CN)
Filed by United Semiconductor (Xiamen) Co., Ltd., Fujian (CN)
Filed on Feb. 1, 2023, as Appl. No. 18/104,777.
Claims priority of application No. 202211553890.X (CN), filed on Dec. 6, 2022.
Prior Publication US 2024/0184281 A1, Jun. 6, 2024
Int. Cl. G06F 11/30 (2006.01); G01M 99/00 (2011.01); G05B 23/02 (2006.01)
CPC G05B 23/0283 (2013.01) [G01M 99/005 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A machine monitoring system, comprising:
a plurality of first machines for a first process;
a plurality of second machines for a second process; and
a control module connected with the first machines and the second machines, wherein the control module is configured to:
define each of the first machines as a high-risk first machine or a low-risk first machine according to a first risk score of each of the first machines;
define each of the second machines as a high-risk second machine or a low-risk second machine according to a second risk score of each of the second machines;
designate one of the first machines being defined as the high-risk first machine as a selected high-risk first machine;
designate one of the second machines being defined as the high-risk second machine as a selected high-risk second machine;
establish a first process path by sorting the selected high-risk first machine and the selected high-risk second machine;
assign an object to be processed by the first process through the selected high-risk first machine and the second process according to the first process path to obtain a processed object; and
determine whether to continue or stop to use the selected high-risk first machine and the first process path according to a test result of the processed object.