| CPC G02F 1/134309 (2013.01) [G02F 1/133345 (2013.01); G02F 1/13439 (2013.01); G02F 1/136286 (2013.01); G02F 1/1368 (2013.01); G02F 1/133707 (2013.01); G02F 1/134363 (2013.01); G02F 1/136227 (2013.01); G02F 2202/10 (2013.01)] | 9 Claims |

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1. A semiconductor substrate, comprising:
a substrate;
a first conductive line disposed on the substrate and extending along a first direction;
a semiconductor layer disposed on the substrate, wherein the first conductive line comprises a first part overlapping with the semiconductor layer and a second part connected to the first part and not overlapping with the semiconductor layer, the first part of the first conductive line has a first width along a second direction different from the first direction, the second part of the first conductive line has a second width along the second direction, and the first width is greater than the second width; and
an electrode disposed on the semiconductor layer and comprising an arc edge outside the first conductive line,
wherein the semiconductor layer comprises a first part extending along the second direction and overlapping with the arc edge and a second part connected to the first part of the semiconductor layer and overlapping with a side of the first part of the first conductive line.
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