US 12,442,893 B2
On-chip reflection coefficient measurement system
Thomas Obermueller, Linz (AT); Andreas Schwarz, Öpping (AT); Stefan Herzinger, Sauerlach (DE); Bernhard Berger, Freistadt (AT); Stefan Schmalzl, Sauerlach (DE); Faisal Ahmed, Linz (AT); and Muhammad Furqan, Linz (AT)
Assigned to Infineon Technologies AG, Neubiberg (DE)
Filed by Infineon Technologies AG, Neubiberg (DE)
Filed on May 25, 2023, as Appl. No. 18/323,967.
Prior Publication US 2024/0393429 A1, Nov. 28, 2024
Int. Cl. G01S 7/40 (2006.01); G01R 29/08 (2006.01)
CPC G01S 7/40 (2013.01) [G01R 29/0892 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A device, comprising:
a receive (Rx) antenna input to couple an Rx antenna to an Rx chain;
a test signal generator to generate a test signal;
a signal coupler to inject the test signal toward the Rx antenna;
an Rx antenna switch configured to:
cause, while in a first switch state, the Rx antenna to be isolated from an Rx chain to generate a first reflected test signal, and
permit, while in a second switch state, the test signal to probe the Rx antenna to generate a second reflected test signal;
the Rx chain configured to:
measure a phasor Y1 of a first baseband signal generated based on the first reflected test signal, and
measure a phasor Y2 of a second baseband signal generated based on the second reflected test signal; and
a control circuit configured to:
compute a complex ratio CR based on the phasor Y1 and the phasor Y2,
compute a measured reflection coefficient Γm based on the complex ratio CR and using a transfer function H, and
monitor an impedance matching of the Rx antenna based on the measured reflection coefficient Γm.