US 12,442,854 B1
Apparatus, system, and method for performing self-contained reliability testing on computing devices
Travis S. Mikjaniec, Freemont, CA (US); Elmer Tolentino, Livermore, CA (US); and Amit Kumar Misra, Bangalore (IN)
Assigned to Juniper Networks, Inc., Sunnyvale, CA (US)
Filed by Juniper Networks, Inc., Sunnyvale, CA (US)
Filed on May 15, 2023, as Appl. No. 18/317,845.
Int. Cl. G01R 31/28 (2006.01)
CPC G01R 31/2874 (2013.01) 20 Claims
OG exemplary drawing
 
1. A computing device comprising:
a cooling device; and
circuitry communicatively coupled to the cooling device, wherein the circuitry is configured to:
alternate between periods of high computing activity that increases heat emission and periods of low computing activity that decreases the heat emission; and
direct the cooling device to decrease cooling power during the periods of high computing activity and increase the cooling power during the periods of low computing activity.