US 12,442,852 B2
Tuning a device under test using parallel pipeline machine learning assistance
John J. Pickerd, Hillsboro, OR (US)
Assigned to Tektronix, Inc., Beaverton, OR (US)
Filed by Tektronix, Inc., Beaverton, OR (US)
Filed on Mar. 24, 2023, as Appl. No. 18/126,342.
Claims priority of provisional application 63/325,373, filed on Mar. 30, 2022.
Prior Publication US 2023/0314498 A1, Oct. 5, 2023
Int. Cl. G01R 31/28 (2006.01); G01R 31/3183 (2006.01); G01R 31/319 (2006.01)
CPC G01R 31/2834 (2013.01) [G01R 31/318307 (2013.01); G01R 31/31908 (2013.01); G01R 31/2862 (2013.01)] 15 Claims
OG exemplary drawing
 
1. A test system, comprising:
ovens, each oven configured to hold a number of devices under test (DUTs);
DUT switches, each switch connected to each of the DUTs in a respective oven;
splitters, each splitter connected to a respective DUT switch, each splitter having two outputs;
an instrument switch connected to one output of each splitter, the other output of each splitter connected to a channel of a test instrument; and
one or more processors configured to execute code that causes the one or more processors to:
control the instrument switch to select one of the DUT switches connected to an oven;
control the selected DUT switch to serially connect each DUT in the oven to a same channel of the test and measurement instrument;
as each DUT is connected, use machine learning to tune the DUT to a set of parameters until the DUT passes or fails operational testing;
repeat the connecting, tuning, and testing of each DUT until all DUTs in an oven have been tested; and
repeat the selection and control of the DUT switches until each DUT in each oven has been tuned and tested.