US 12,442,851 B2
Systems and methods for remaining useful life prediction in electronics
Harish Krishnamoorthy, Missouri City, TX (US); and Joshua Hawke, Bloomington, IN (US)
Assigned to UNIVERSITY OF HOUSTON SYSTEM, Houston, TX (US); and THE GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF THE NAVY, Arlington, VA (US)
Filed by University of Houston System, Houston, TX (US); and The United States of America, as represented by the Secretary of the Navy, Arlington, VA (US)
Filed on Oct. 7, 2022, as Appl. No. 17/961,803.
Claims priority of provisional application 63/253,691, filed on Oct. 8, 2021.
Prior Publication US 2023/0160950 A1, May 25, 2023
Int. Cl. G01R 31/26 (2020.01); G01R 31/28 (2006.01); G01R 31/64 (2020.01)
CPC G01R 31/2621 (2013.01) [G01R 31/2834 (2013.01); G01R 31/2837 (2013.01); G01R 31/2844 (2013.01); G01R 31/2846 (2013.01); G01R 31/64 (2020.01)] 19 Claims
OG exemplary drawing
 
1. A method for estimating a remaining lifetime of an electronic component, comprising:
measuring a circuit parameter for a circuit component at a plurality of different stressors;
determining a probability density function (PDF) of remaining life as a function of time for the circuit component and the measured circuit parameter at the plurality of different stressors; and
combining the PDF of failure for the circuit component with at least one additional PDF of remaining life as a function of a circuit that contains the circuit component.