| CPC G01R 13/029 (2013.01) [G01R 13/0218 (2013.01); G01R 23/02 (2013.01)] | 18 Claims |

|
1. A test and measurement device, comprising:
an input port configured to receive a signal from a device under test, the signal having a symbol rate;
one or more analog-to-digital converters to convert the signal to waveform samples at a sampling rate; and
one or more processors configured to execute code that, when aliasing is present, causes the one or more processors to:
determining that aliasing is present when a Nyquist frequency of the sampling rate is less than or equal to a bandwidth of the device and that the sampling rate is greater than the symbol rate;
up-sample a portion of the signal between the Nyquist frequency and the bandwidth having aliased samples to produce up-sampled samples using a sample rate that supports real-time sampling;
use the up-sampled samples to produce a real-time waveform;
perform clock recovery on the real-time waveform to produce a recovered clock; and
resample the aliased samples using the recovered clock to produce a non-aliased waveform.
|