US 12,442,798 B2
System and method for testing of monocrystalline components
Dawei Yan, Derby (GB); and Victoriya Ageeva, Derby (GB)
Assigned to Rolls-Royce plc, London (GB)
Filed by ROLLS-ROYCE plc, London (GB)
Filed on Aug. 26, 2022, as Appl. No. 17/822,466.
Claims priority of application No. 2112995 (GB), filed on Sep. 13, 2021.
Prior Publication US 2023/0079690 A1, Mar. 16, 2023
Int. Cl. G01N 29/24 (2006.01); G01N 29/06 (2006.01); G01N 29/07 (2006.01)
CPC G01N 29/2468 (2013.01) [G01N 29/069 (2013.01); G01N 29/07 (2013.01); G01N 2291/0289 (2013.01)] 17 Claims
OG exemplary drawing
 
1. A method for testing of a population of monocrystalline components, the method comprising the steps of:
obtaining a plurality of component parameters associated with the population of monocrystalline components, wherein each monocrystalline component of the population of monocrystalline components comprises at least one of a material having a single crystal or a material having multiple crystals oriented in a same crystal orientation, and wherein the plurality of component parameters comprises:
a crystal orientation of each monocrystalline component from the population of monocrystalline components with respect to a coordinate axis common to the population of monocrystalline components, a three-dimensional geometry common to the population of monocrystalline components, and a material common to the population of monocrystalline components, wherein the crystal orientation comprises a crystal angle relative to the coordinate axis;
determining a statistical parameter associated with the population of monocrystalline components based on a statistical distribution of the crystal angle across the population of monocrystalline components;
generating a simulation model of the monocrystalline component representative of the population of monocrystalline components based at least partially on the statistical parameter, the three-dimensional geometry, and the material;
determining at least one probe parameter of an inspection probe arrangement based at least partially on the simulation model and a predetermined region of interest in the three-dimensional geometry, wherein the inspection probe arrangement comprises at least one probe configured to emit ultrasonic waves;
determining anisotropic delay laws based at least partially on the statistical parameter and the at least one probe parameter; and
controlling the at least one probe based on the anisotropic delay laws to emit the ultrasonic waves towards a predetermined region of interest of at least one monocrystalline component from the population of monocrystalline components corresponding to the predetermined region of interest in the three-dimensional geometry in order to test the at least one monocrystalline component for one or more abnormalities.