US 12,442,778 B2
Measurement method and apparatus, and radiation measuring device
Liangjie Yan, Ningde (CN); and Xing Wang, Ningde (CN)
Assigned to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED, Hong Kong (CN)
Filed by CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED, Hong Kong (CN)
Filed on Oct. 3, 2023, as Appl. No. 18/479,898.
Application 18/479,898 is a continuation of application No. PCT/CN2023/095012, filed on May 18, 2023.
Claims priority of application No. 202210575858.5 (CN), filed on May 25, 2022.
Prior Publication US 2024/0027368 A1, Jan. 25, 2024
Int. Cl. G01N 23/02 (2006.01); G01N 23/20025 (2018.01); H01M 10/42 (2006.01)
CPC G01N 23/02 (2013.01) [G01N 23/20025 (2013.01); H01M 10/4285 (2013.01); G01N 2223/03 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A measurement method for measuring a mass parameter of a workpiece being measured, the method comprising:
determining a measured mass parameter of the workpiece being measured based on radiation intensity of rays that have passed through the workpiece being measured; and
correcting the measured mass parameter using a displacement curve function of the workpiece being measured in a measurement environment, to obtain the corrected mass parameter of the workpiece being measured, wherein the displacement eurve function is used to characterize influence of environmental factors on radiation in the measurement environment and is obtained by:
obtaining measured mass parameters of at least two demarcation pieces measured based on radiation intensity of rays that have passed through the at least two demarcation pieces; and
solving for parameter values of an initial function according to the measured mass parameters of the at least two demarcation pieces and actual mass parameters of the at least two demarcation pieces to obtain the displacement function.