| CPC G01J 5/20 (2013.01) | 20 Claims |

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1. A sensor device configured for a selected wavelength, the device comprising:
a silicon substrate comprising a backside region and a frontside region, wherein the silicon substrate comprises a plurality of v-grooves formed within the frontside region;
a first GaAs buffer region overlying the plurality of v-grooves;
a defect filter layer (DFL) region overlying the first GaAs buffer region;
a second GaAs buffer region overlying the DFL region;
an n+ GaAs contact region overlying the second GaAs buffer region;
a strained InxGa1-xAs (P) absorber region overlying the n+ GaAs contact region;
a p-GaAs spacer region overlying the InxGa1-xAs (P) absorber region; and
a p+ GaAs contact region overlying the p-GaAs spacer region.
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