US 12,440,097 B2
OCT device
Ai Takaya, Gamagori (JP); Norimasa Satake, Gamagori (JP); and Yukihiro Higuchi, Gamagori (JP)
Assigned to NIDEK CO., LTD., Gamagori (JP)
Appl. No. 17/640,674
Filed by NIDEK CO., LTD., Gamagori (JP)
PCT Filed Aug. 28, 2020, PCT No. PCT/JP2020/032705
§ 371(c)(1), (2) Date Mar. 4, 2022,
PCT Pub. No. WO2021/044982, PCT Pub. Date Nov. 3, 2021.
Claims priority of application No. 2019-161606 (JP), filed on Sep. 4, 2019.
Prior Publication US 2022/0322932 A1, Oct. 13, 2022
Int. Cl. A61B 3/10 (2006.01); A61B 3/12 (2006.01); A61B 3/14 (2006.01)
CPC A61B 3/102 (2013.01) [A61B 3/1005 (2013.01); A61B 3/12 (2013.01); A61B 3/14 (2013.01)] 4 Claims
OG exemplary drawing
 
1. An OCT device comprising:
an OCT optical system that includes a beam splitter for splitting a beam from an OCT light source into a measurement optical path and a reference optical path and an optical path length adjuster configured to change an optical path length of at least one of the measurement optical path and the reference optical path, the OCT optical system being configured to detect a spectral interference signal between measurement light guided to a fundus of an examinee's eye via the measurement optical path and reference light from the reference optical path;
a processor programmed to:
acquire ocular axial length information that is a measurement of an ocular axial length value of the examinee's eye,
acquire OCT data of the fundus by processing the spectral interference signal output from the OCT optical system; and
determine whether to set a zero delay position on a shallower layer side than a retina in a central region of the fundus of the examinee's eye or on a deeper layer side than a choroid in the central region of the examinee's eye based at least on a comparison of the measured ocular axial length information to a predetermined threshold, wherein the zero delay position is located where the optical path lengths of the measurement optical path and the reference optical path coincide with each other.