US 12,112,820 B2
Single event effect mitigation with smart-redundancy
Aurelien Alacchi, Salt Lake City, UT (US); and Pierre-Emmanuel Gaillardon, Salt Lake City, UT (US)
Assigned to University of Utah Research Foundation, Salt Lake City, UT (US)
Filed by University of Utah Research Foundation, Salt Lake City, UT (US)
Filed on Dec. 1, 2021, as Appl. No. 17/539,923.
Prior Publication US 2023/0170038 A1, Jun. 1, 2023
Int. Cl. G11C 29/44 (2006.01); G11C 7/06 (2006.01); G11C 7/10 (2006.01); G11C 29/00 (2006.01); G11C 29/38 (2006.01)
CPC G11C 29/4401 (2013.01) [G11C 7/06 (2013.01); G11C 7/1057 (2013.01); G11C 7/1084 (2013.01); G11C 29/38 (2013.01); G11C 29/789 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A electronic device for single event effect mitigation, comprising:
a processor;
a memory cell comprising:
a substrate;
a deep well coupled to the substrate; and
a ground-coupled well coupled to the deep well;
an integrated particle sensor comprising one or more p-n junctions intentionally configured for actively detecting particle strikes, the integrated particle sensor coupled between:
the substrate and the deep well, and
the ground-coupled well and the deep well,
wherein the integrated particle sensor is operable to detect an ionizing radiation particle generating the single event effect and output a corresponding detection signal; and
a sensor conditioner coupled to directly receive the detection signal from the integrated particle sensor, wherein the sensor conditioner includes a current-to-voltage converter, an amplifier, and a pulse generator, and wherein the sensor conditioner is tuned to process the detection signal to generate a pulse and activate reconfiguration to a redundant memory cell when the single event effect occurs.